Paper
6 February 2020 An analytical method for investigations of acoustic phonons spectra in semiconductor ultra-thin flat films
Author Affiliations +
Proceedings Volume 11369, Fourteenth International Conference on Correlation Optics; 113691D (2020) https://doi.org/10.1117/12.2553960
Event: Fourteenth International Conference on Correlation Optics, 2019, Chernivtsi, Ukraine
Abstract
An analytical approach for determine the acoustic phonon dispersion relation in the qusi-2D nanosystems such as flat ultra-thin flat films is represented there. Method is based on the representation the components of polarization vectors for all possible phonon branches in the film of finite thickness as appropriate Fourier series. This made it possible to establish the analytical dependencies of energy on the frequency for all branches of the acoustic phonon spectrum in ultra-thin films. Such results can allow an analytical investigations of the electron spectra transformations that caused by electrons interaction with acoustic phonons in the ultra-thin films by variation of their thicknesses.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. V. Derevyanchuk, Yu. V. Lutsiuk, and V. M. Kramar "An analytical method for investigations of acoustic phonons spectra in semiconductor ultra-thin flat films", Proc. SPIE 11369, Fourteenth International Conference on Correlation Optics, 113691D (6 February 2020); https://doi.org/10.1117/12.2553960
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
Back to Top