Paper
27 November 1989 Short Wavelength Imaging Characteristics Of Figured Multilayer Mirrors
Brian L. Evans, Ali M. H. Al Arab, Shi Xu
Author Affiliations +
Abstract
At short wavelengths (λ - 5nm) a highly reflecting multilayer must consist of a large number of layers, in which the layer interfaces are sharply defined and the strongly absorbing (metal) component layers are as thin as possible. The mininum thickness of a microcrystalline metal layer is apparently set by the unit cell dimensions, the lateral dimensions of each microcrystallite, by the deposition conditions and nature of the metal. The influence of these parameters is described and related to the fabrication of short wavelength reflecting mirrors.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian L. Evans, Ali M. H. Al Arab, and Shi Xu "Short Wavelength Imaging Characteristics Of Figured Multilayer Mirrors", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961855
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Reflectivity

Nickel

Particles

Metals

Interfaces

Mirrors

Carbon

Back to Top