Numerical Simulation Of Images Of Perfectly Conducting Rough Surfaces In Scanning Microscopy

J. Felix Aguilar; Eugenio R. MENDEZ

doi:10.1117/12.962711

22 December 1989 Numerical Simulation Of Images Of Perfectly Conducting Rough Surfaces In Scanning Microscopy

J. Felix Aguilar, Eugenio R. MENDEZ

Proceedings Volume 1161, New Methods in Microscopy and Low Light Imaging; (1989) https://doi.org/10.1117/12.962711
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

The problem of microscopic image formation with optically thick, highly reflecting objects is examined. The optical system considered is a focussed beam scanning microscope with an S-polarized source. The surfaces studied, assumed perfectly conducting, consist of steps, ridges and grooves. Our approach is only two-dimensional but otherwise quite rigorous. The boundary conditions for the electromagnetic field on the surface are determined by solving numerically an integral equation and the resulting images are compared with those found using the Kirchhoff approximation.

Citation Download Citation

J. Felix Aguilar and Eugenio R. MENDEZ "Numerical Simulation Of Images Of Perfectly Conducting Rough Surfaces In Scanning Microscopy", Proc. SPIE 1161, New Methods in Microscopy and Low Light Imaging, (22 December 1989); https://doi.org/10.1117/12.962711

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available