Paper
4 December 2020 Research on wavefront metrology of continuous phase plate with large gradient based on phase retrieval
Hao Yan, Baojian Ji, Shenglin Wen, Qikai Shi
Author Affiliations +
Proceedings Volume 11617, International Conference on Optoelectronic and Microelectronic Technology and Application; 1161738 (2020) https://doi.org/10.1117/12.2585436
Event: International Conference on Optoelectronic and Microelectronic Technology and Application, 2020, Nanjing, China
Abstract
The continuous phase plate with a large wavefront gradient is used as the far-field beam shaping element in some highpower laser physics experiments. During the fabrication of continuous phase plate and before the actual use, it is necessary to measurement its wavefront to judge the fabrication quality and whether the wavefront distribution meets the requirement of use. By constructing a novel amplitude replacement phase retrieval algorithm with variable weighting factor, fast and high precision reconstruction of CPP with large wavefront gradient can be achieved. The proposed method is validated by numerical simulation and experiment.
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Hao Yan, Baojian Ji, Shenglin Wen, and Qikai Shi "Research on wavefront metrology of continuous phase plate with large gradient based on phase retrieval", Proc. SPIE 11617, International Conference on Optoelectronic and Microelectronic Technology and Application, 1161738 (4 December 2020); https://doi.org/10.1117/12.2585436
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