Presentation + Paper
20 June 2021 Analysis of resolution enhancement through microsphere-assisted interferometry in the 3D spatial frequency domain
Author Affiliations +
Abstract
In optical metrology various approaches have been made in order to push the physical limitations of lateral resolution in microscopic and interferometric devices. Microsphere-assisted interferometry enables the measurement of structures well below Abbe’s resolution limit. In order to give an approach for analyzing the obtained measurement data, this study shows the transfer behavior in the three-dimensional spatial frequency domain. With the construction of an Ewald sphere further insight into the role of microspheres in the imaging process can be obtained. For improved analysis, selective illumination is applied to the select those parts of the field of view where the microsphere is located. Further improvement is achieved by appropriate windowing of the measurement data.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lucie Hüser and Peter Lehmann "Analysis of resolution enhancement through microsphere-assisted interferometry in the 3D spatial frequency domain", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117820R (20 June 2021); https://doi.org/10.1117/12.2593296
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KEYWORDS
3D metrology

Interferometry

Resolution enhancement technologies

Near field optics

Spatial resolution

Near field

Microscopy

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