A novel pattern-free phase unwrapping algorithm

Qingkang Bao; Chunwei Zhang; Faheng Liu; Zhenyang Zhang; Tianyu Zhang; Hong Zhao

doi:10.1117/12.2604755

1 November 2021 A novel pattern-free phase unwrapping algorithm

Qingkang Bao, Chunwei Zhang, Faheng Liu, Zhenyang Zhang, Tianyu Zhang, Hong Zhao

Proceedings Volume 12057, Twelfth International Conference on Information Optics and Photonics; 120571B (2021) https://doi.org/10.1117/12.2604755
Event: Twelfth International Conference on Information Optics and Photonics, 2021, Xi'an, China

Abstract

Phase unwrapping plays a vital role in fringe projection profilometry which is an outstanding three-dimensional (3D) shape measurement method. This paper proposed a novel phase unwrapping algorithm that requires no extra patterns needed in conventional temporal phase unwrapping algorithms. The proposed method unwraps the wrapped phase map of the newest measurement with the help of the unwrapped one from the previous measurement. It applies temporal phase unwrapping algorithm first, and then detects the wrongly unwrapped points caused by the misalignment of phase edges, and finally corrects the phase of these points using spatial phase unwrapping algorithm. The method proposed can largely reduce the number of patterns needed for continuous dynamic measurement. Meanwhile, it can resist larger noise than multifrequency phase unwrapping algorithm because the noise of the reference phase map is not amplified. Besides, it can effectively solve the problem of abnormal phases caused by the misalignment between the phase edges of successive phase maps due to object motion. Moreover, the proposed algorithm is capable of retrieving the absolute phase map of multiple surfaces. The system developed with this algorithm can obtain the 3D shape of the object by just a single shot during the continuous dynamic measurement.

Citation Download Citation

Qingkang Bao, Chunwei Zhang, Faheng Liu, Zhenyang Zhang, Tianyu Zhang, and Hong Zhao "A novel pattern-free phase unwrapping algorithm", Proc. SPIE 12057, Twelfth International Conference on Information Optics and Photonics, 120571B (1 November 2021); https://doi.org/10.1117/12.2604755

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KEYWORDS

Fringe analysis

3D metrology

Phase shifts

Cameras

Projection systems

Calibration

Digital Light Processing

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