Paper
24 November 2021 Ultra-precision detection of surface defects of large aperture diffraction grating based on machine vision
Author Affiliations +
Abstract
Diffraction grating is an important optical device whose surface defects will seriously affect the quality of optical system.In order to achieve the diffraction grating of the ultra precision surface defect inspection, design a set of defects automatic detection system based on machine vision, we use black hat transform images highlight several images, and after a Canny edge detection, expansion, corrosion, determine the connected domain, look for the seed point, the algorithm of region growing process, realize the defect feature extraction, classification and statistics.A two-dimension displacement platform controlled by DSP is designed to realize the panoramic image Mosaic of diffraction grating and accurately locate the coordinates of defects.At the same time, the surface quality of the grating is evaluated according to the American military optical appearance standard MIL-PRF-13830B.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haotian Wang, Chaoming Li, Xinrong Chen, Zhe Huang, Jiayao Pan, and Tao Wu "Ultra-precision detection of surface defects of large aperture diffraction grating based on machine vision", Proc. SPIE 12069, AOPC 2021: Novel Technologies and Instruments for Astronomical Multi-Band Observations, 1206910 (24 November 2021); https://doi.org/10.1117/12.2606743
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffraction gratings

Image processing

Defect detection

Optical components

Machine vision

Optics manufacturing

Digital signal processing

RELATED CONTENT

A defect detection method for glass bottle mouth based on...
Proceedings of SPIE (November 11 2021)
New area and edge based stereo algorithm and its...
Proceedings of SPIE (July 22 1997)
Color-Edge Detectors for a VLSI Convolver
Proceedings of SPIE (November 01 1989)
Visual detection of defects in solder joints
Proceedings of SPIE (March 27 1995)

Back to Top