Paper
14 October 2022 Research on the uniformity of the nano-grating pitch based on comparative measurement
Xinyuan Zou, Zhiping Zhang, Xiaofeng Yang, Chen Zhang
Author Affiliations +
Proceedings Volume 12343, 2nd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2022); 123431Z (2022) https://doi.org/10.1117/12.2648781
Event: 2nd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2022), 2022, Qingdao, China
Abstract
The grating pitch is an essential structural parameter of the grating. In the precision displacement measurement system, the grating pitch as the measurement reference directly affects the measurement results. In order to ensure the accuracy of the measurement, the grating pitch needs to be detected. Based on the laser interference principle and grating diffraction principle, this paper proposes a new method to convert the grating pitch into interferometer and grating displacement comparison during the grating motion. The experimental results show that the measurement error is less than 1.2 nm and the uniformity error is less than 0.34 for the grating with 833 nm pitch, which verifies the method's feasibility.
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinyuan Zou, Zhiping Zhang, Xiaofeng Yang, and Chen Zhang "Research on the uniformity of the nano-grating pitch based on comparative measurement", Proc. SPIE 12343, 2nd International Conference on Laser, Optics and Optoelectronic Technology (LOPET 2022), 123431Z (14 October 2022); https://doi.org/10.1117/12.2648781
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KEYWORDS
Diffraction gratings

Interferometers

Motion measurement

Distance measurement

Diffraction

Reflectors

Doppler effect

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