An optical metrology system for fully automated waveguide image quality measurements

Murat Deveci; Thomas Kerst; Janne Simonen; Pekka Laiho

doi:10.1117/12.2644852

16 March 2023 An optical metrology system for fully automated waveguide image quality measurements

Murat Deveci, Thomas Kerst, Janne Simonen, Pekka Laiho

Proceedings Volume 12449, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) IV; 124491I (2023) https://doi.org/10.1117/12.2644852
Event: SPIE AR | VR | MR, 2023, San Francisco, California, United States

Conference Poster

Abstract

An immersive augmented reality experience requires adapting the display/optical engine to the human visual system, which introduces many measurement and testing challenges. Near-eye displays often use waveguide combiners to produce superior image quality, thereby placing special demands on the metrology needs. Hence, this challenging application requires robust and state-of-the-art mechanics, and optical setup. In this study, an optical metrology system that can perform various image quality analyses on diced (eyepieces) and undiced (wafer level) waveguides is described. Our novel optical metrology system consists of a human-eye mimicking optical setup, and a multi-axis highly accurate robotics.

Citation Download Citation

Murat Deveci, Thomas Kerst, Janne Simonen, and Pekka Laiho "An optical metrology system for fully automated waveguide image quality measurements", Proc. SPIE 12449, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) IV, 124491I (16 March 2023); https://doi.org/10.1117/12.2644852

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