High NA lens assessment using self-interference incoherent digital holography

Youngrok Kim; Hyunsik Sung; Wonseok Son; Sung-Wook Min

doi:10.1117/12.2673493

15 August 2023 High NA lens assessment using self-interference incoherent digital holography

Youngrok Kim, Hyunsik Sung, Wonseok Son, Sung-Wook Min

Proceedings Volume 12618, Optical Measurement Systems for Industrial Inspection XIII; 126182A (2023) https://doi.org/10.1117/12.2673493
Event: SPIE Optical Metrology, 2023, Munich, Germany

Conference Poster

Abstract

We propose a lens assessment method based on incoherent holography, offering a novel alternative to conventional optical testing methods that rely on coherent illumination and interferometry. The traditional approach involves the complicated optical configurations and it is hard to accurately model the actual user experience. In contrast, our proposed incoherent holographic system, utilizing self-interference with a geometric phase lens, enables the acquisition of the complex hologram of incoherent illumination in a single exposure. By reconstructing the hologram captured from structured light patterns, we can calculate the wavefront aberration and displacement, providing a comprehensive lens assessment solution.

Citation Download Citation

Youngrok Kim, Hyunsik Sung, Wonseok Son, and Sung-Wook Min "High NA lens assessment using self-interference incoherent digital holography", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126182A (15 August 2023); https://doi.org/10.1117/12.2673493

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