Simple method for evaluating plano-convex aspherical lenses

Oliver Huerta-Carranza; Manuel Campos-García; Fermín S. Granados-Agustín; Agustín Santiago-Alvarado; Alejandro Cornejo Rodríguez; Maximino Avendaño-Alejo

doi:10.1117/12.2673851

10 August 2023 Simple method for evaluating plano-convex aspherical lenses

Oliver Huerta-Carranza, Manuel Campos-García, Fermín S. Granados-Agustín, Agustín Santiago-Alvarado, Alejandro Cornejo Rodríguez, Maximino Avendaño-Alejo

Author Affiliations +

Proceedings Volume 12619, Modeling Aspects in Optical Metrology IX; 126190W (2023) https://doi.org/10.1117/12.2673851
Event: SPIE Optical Metrology, 2023, Munich, Germany

Conference Poster

Abstract

Nowadays, optical systems commonly use either aspheric or free-form surfaces to improve their performance; however, to ensure that the manufactured surfaces become successful in concordance with to the nominal design, some geometrical parameters such as radius of curvature, conic constant, aspheric coefficients, etc., must be measured, including the surface shape under test. In this work, we propose a simple method to evaluate the optical quality of a plano-convex aspheric lens, where the convex face is modeled as an aspheric or free-form surface. We design a non-uniform pattern on the plane face of the plano-convex lens, to obtain a uniform pattern on a predefined detection plane by using the law of refraction in vector form. Additionally, implementing numerical simulations, we calculate the synthetic images produced through a predefined optical surface that we will use as if they were obtained from an experimental test. Finally, we apply an iterative method to retrieve the shape of the surface by using the normal vector field to demonstrate the feasibility of our proposal.

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Oliver Huerta-Carranza, Manuel Campos-García, Fermín S. Granados-Agustín, Agustín Santiago-Alvarado, Alejandro Cornejo Rodríguez, and Maximino Avendaño-Alejo "Simple method for evaluating plano-convex aspherical lenses", Proc. SPIE 12619, Modeling Aspects in Optical Metrology IX, 126190W (10 August 2023); https://doi.org/10.1117/12.2673851

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