Paper
28 July 2023 Enhanced key-point detection for plenoptic imaging
Author Affiliations +
Proceedings Volume 12749, Sixteenth International Conference on Quality Control by Artificial Vision; 127490T (2023) https://doi.org/10.1117/12.2692367
Event: Sixteenth International Conference on Quality Control by Artificial Vision, 2023, Albi, France
Abstract
Standard imaging techniques do not get as much information from a scene as light-field imaging. Light-field (LF) cameras can measure the light intensity reflected by an object and, most importantly, the direction of its light rays. This information can be used in different applications, such as depth estimation, in-plane focusing, creating full-focused images, etc. However, standard key-point detectors often employed in computer vision applications cannot be applied directly to plenoptic images due to the nature of raw LF images. This work presents an approach for key-point detection dedicated to plenoptic images. Our method allows using of conventional key-point detector methods. It forces the detection of this key-point in a set of micro-images of the raw LF image. Obtaining this important number of key-points is essential for applications that require finding additional correspondences in the raw space, such as disparity estimation, indirect visual odometry techniques, and others. The approach is set to the test by modifying the Harris key-point detector.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Al Assaad, S. Bazeille, T. Josso-Laurain, A. Dieterlen, and C. Cudel "Enhanced key-point detection for plenoptic imaging", Proc. SPIE 12749, Sixteenth International Conference on Quality Control by Artificial Vision, 127490T (28 July 2023); https://doi.org/10.1117/12.2692367
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KEYWORDS
Cameras

Visualization

Calibration

Microlens

Depth maps

Image enhancement

Interpolation

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