Open Access Paper
16 August 2023 Front Matter: Volume 12787
Proceedings Volume 12787, Sixth International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2023); 1278701 (2023) https://doi.org/10.1117/12.3005337
Event: 6th International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE 2023), 2023, Shenyang, China
Abstract
“This PDF file contains the front matter associated with SPIE Proceedings Volume 12787, including the Title Page, Copyright information, Table of Contents, and Committee Page.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Sixth International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2023), edited by Lvqing Yang, Wenjun Tan, Proc. of SPIE 12787, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510668249

ISBN: 9781510668256 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

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Copyright © 2023 Society of Photo-Optical Instrumentation Engineers (SPIE).

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher.

Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

Publication of record for individual papers is online in the SPIE Digital Library.

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Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Conference General Chair

  • Defu Zhang, Xiamen University (China)

Conference Co-chair

  • Jingbo Xia, Xiamen University Tan Kah Kee College (China)

Local Organizing Committee Chair

  • Lianqiang Niu, Shenyang University of Technology (China)

Technical Program Committee Chair

  • Guandong Xu, University of Technology Sydney (Australia)

Publication Chair

  • Lvqing Yang, Xiamen University (China)

International Advisory Board Chairs

  • Hari Mohan Srivastava, University of Victoria (Canada)

  • M. A. Jabbar, Vardhaman College of Engineering (India)

Technical Program Committee

  • Wen Li, North China University of Technology (China)

  • Sitong Lu, North China University of Technology (China)

  • Zhiyi Fang, Jilin University (China)

  • Xiaochun Cheng, Middlesex University (United Kingdom)

  • Fadi Hage Chehade, Institut Supérieur du Bâtiment et des Travaux Publics (France)

  • Giampiero Chiaselotti, Università della Calabria (Italy)

  • Guoxin Su, University of Wollongong (Australia)

  • Mohammad Arab Firoozjaee, University of Science and Technology of Mazandaran (Iran)

  • David Chua Sing Ngie, Universiti Malaysia Sarawak (Malaysia)

  • Vishnu Narayan Mishra, Indira Gandhi National Tribal University (India)

  • Sachin Kumar, SRM Institute of Science and Technology (India)

  • Xinwei Yao, Zhejiang University of Technology (China)

  • Yaobing Wang, Southwest University of Science and Technology (China)

  • Yan Liu, Shantou University (China)

  • Guokun Zeng, Harbin Institute of Technology (China)

  • Xin Zhang, Changchun University of Science and Technology (China)

  • Krisda Yingkayun, Rajamangala University of Technology Lanna (Thailand)

  • Liangshan Shao, Liaoning University of Technology (China)

  • Yu-Dong Zhang, University of Leicester (United Kingdom)

  • Tingdong Ye, Guangdong Polytechnic (China)

  • Li Guo, Hunan University (China)

  • Wenjun Tan, Northeastern University (China)

  • Yasmina Belaroussi, Center for Development of Advanced Technologies (Algeria)

  • Chang Tang, China University of Geosciences (China)

  • Nor Farhani Zakaria, Universiti Malaysia Perlis (Malaysia)

  • Zhe Chen, Dalian University of Technology (China)

  • Sachin Kumar, Kyungpook National University (South Korea)

  • Banxiang Duan, Guangdong Institute of Science and Technology (China)

  • Emna Aridhi, University of Carthage (Tunisia)

© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12787", Proc. SPIE 12787, Sixth International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2023), 1278701 (16 August 2023); https://doi.org/10.1117/12.3005337
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KEYWORDS
Algorithm development

Data modeling

Detection and tracking algorithms

Evolutionary algorithms

Instrument modeling

Performance modeling

Visual process modeling

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