Design of all-pass optical microring resonators based on silicon-on-insulator waveguides

J. D. Castro-Toscano; R. Salas-Montiel; D. Jauregui-Vazquez; H. J. Tiznado-Vázquez; E. G. Lizárraga-Medina; A. G. Navarrete-Alcala; H. Márquez-Becerra

doi:10.1117/12.3027283

1 October 2024 Design of all-pass optical microring resonators based on silicon-on-insulator waveguides

J. D. Castro-Toscano, R. Salas-Montiel, D. Jauregui-Vazquez, H. J. Tiznado-Vázquez, E. G. Lizárraga-Medina, A. G. Navarrete-Alcala, H. Márquez-Becerra

Author Affiliations +

Proceedings Volume 13129, Optical Modeling and Performance Predictions XIV; 131290S (2024) https://doi.org/10.1117/12.3027283
Event: Optical Engineering + Applications, 2024, San Diego, California, United States

Conference Poster

Abstract

In the realm of thin film fabrication, Atomic Layer Deposition (ALD) is a versatile technique that facilitates the growth of high-quality and precision films for various applications, such as micro-electronics focused on chips. ALD-deposited materials on an insulator platform can expand their potential to include optics and photonics. This study introduces the design and numerical simulation of integrated optics all-pass microring resonators (AOR) cavities. These designs are based on the measured optical characteristics of materials deposited via ALD, specifically aluminum, titanium, and zinc oxides, recognized as transparent materials on Si/SiO₂ (insulator) platforms. This platform is based on a channel waveguide from a subwavelength cross-section dimension selected to propagate fundamental modes, considering a suitable cross-section scale, good modal confinement, and optimal deep evanescent wave distance. In addition, the following parameters were discussed to propose an optimal AOR configuration: distance gap, high transmission, extinction ratio, resonant wavelength, full-width half maximum, free spectral range, finesse, quality factor, propagation losses, and ring radius. In optical communication applications focused in the telecommunication window (1.55μm), for its excellent fundamental mode confinement, with an evanescent decay of 855μm, a quality factor reaching up to 10⁴, the zinc oxide on an insulator (ZOI) was the best configuration. The outcomes suggest that employing atomic layer deposition to synthesis of core materials on an insulator presents a viable alternative platform for optics and photonics devices.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

J. D. Castro-Toscano, R. Salas-Montiel, D. Jauregui-Vazquez, H. J. Tiznado-Vázquez, E. G. Lizárraga-Medina, A. G. Navarrete-Alcala, and H. Márquez-Becerra "Design of all-pass optical microring resonators based on silicon-on-insulator waveguides", Proc. SPIE 13129, Optical Modeling and Performance Predictions XIV, 131290S (1 October 2024); https://doi.org/10.1117/12.3027283

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available