Analysis of the quality degradation of segmented planar imaging detectors due to the accuracy of phase shifter phase shifting

Weiping Gao; Yanghui He; Fang Chang; Zhixun Wang; Feipeng Wang

doi:10.1117/12.3018863

30 April 2024 Analysis of the quality degradation of segmented planar imaging detectors due to the accuracy of phase shifter phase shifting

Weiping Gao, Yanghui He, Fang Chang, Zhixun Wang, Feipeng Wang

Author Affiliations +

Proceedings Volume 13154, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Detector Technologies; 131540K (2024) https://doi.org/10.1117/12.3018863
Event: Sixth Conference on Frontiers in Optical Imaging Technology and Applications (FOI2023), 2023, Nanjing, JS, China

Abstract

The segmented planar imaging method is a new imaging concept based on Van Cittert-Zernike theory that offers significantly reduced size, weight, and power consumption replacing traditional refracting/reflecting telescopes with photonic integrated circuits (PICs). As one of the key components, the phase shifter plays a role in compensating for phase, and its phase shift accuracy has an important impact on the imaging quality of segmented planar imaging detectors. In this paper, a degradation model of the accuracy of phase shifters on the degradation of imaging quality is established and the impact of phase shifter accuracy on system imaging quality is analyzed. The tolerance error of phase shifter phase shift accuracy was determined γ≤10% by analyzing the imaging results of spectral channels corresponding to different paired baselines under the same phase shifter phase shift accuracy. The analysis conclusion provides a theoretical basis for the manufacturing of segmented planar imaging detector.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Weiping Gao, Yanghui He, Fang Chang, Zhixun Wang, and Feipeng Wang "Analysis of the quality degradation of segmented planar imaging detectors due to the accuracy of phase shifter phase shifting", Proc. SPIE 13154, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Detector Technologies, 131540K (30 April 2024); https://doi.org/10.1117/12.3018863

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