Paper
3 June 2024 Three-dimensional reconstruction based on three-dimensional phase mapping using single-pixel imaging
Yemei Liu, Yanfei Li, Jing Yu, Yupei Miao, Xiaoli Liu, Xiang Peng, Qijian Tang
Author Affiliations +
Proceedings Volume 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024); 131820F (2024) https://doi.org/10.1117/12.3030436
Event: 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 2024, Kunming, China
Abstract
The single-pixel imaging technique has garnered widespread attention and research due to its low requirements on detector resolution and equipment cost. In this study, a laser point scanning single-pixel imaging system is constructed. It utilizes a grating installed in front of the detector to capture a single-frame deformed fringe pattern, combining Fourier transform profilometry with three-dimensional phase mapping to ultimately achieve three-dimensional data acquisition. Following the calibration of the system, the positions of each light ray are calibrated using the intrinsic and extrinsic parameters obtained through camera calibration. Consequently, this paper proposes a single-pixel three-dimensional reconstruction method based on three-dimensional phase mapping, establishing a correlation between three-dimensional points and phases to realize three-dimensional phase mapping. Experimental results demonstrate that the model can achieve high reconstruction accuracy, presenting a novel solution for the field of single-pixel three-dimensional reconstruction.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yemei Liu, Yanfei Li, Jing Yu, Yupei Miao, Xiaoli Liu, Xiang Peng, and Qijian Tang "Three-dimensional reconstruction based on three-dimensional phase mapping using single-pixel imaging", Proc. SPIE 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 131820F (3 June 2024); https://doi.org/10.1117/12.3030436
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KEYWORDS
3D modeling

Calibration

High dynamic range imaging

3D image reconstruction

Sensors

Cameras

Fringe analysis

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