Paper
5 July 2024 PCA combined with SVM assisted fluorescence spectroscopy for classification of microplastics
Author Affiliations +
Proceedings Volume 13183, International Conference on Optoelectronic Information and Functional Materials (OIFM 2024); 131830P (2024) https://doi.org/10.1117/12.3033871
Event: The 3rd International Conference on Optoelectronic Information and Functional Materials (OIFM 2024), 2024, Wuhan, China
Abstract
Microplastic (MP) pollution presents a significant challenge to environmental protection and requires rapid detection and classification methods. We utilize machine learning methods coupled with fluorescence spectroscopy detection to improve the accuracy of MP detection and classification. To comprehensively explore MP classification, Principal Component Analysis (PCA) and PCA-SVM methods are used to analyze 2400 spectral data samples of six types of MPs. Each MP category is divided into a training set comprising 200 spectra and a test set containing 200 spectra to ensure robust evaluation. The initial SVM model achieves 100% classification accuracy for the test set, the associated computational burden is significant, with a training time of 42.14 seconds and a prediction time of 8.23 seconds. To enhance efficiency, we integrate the PCA algorithm, which reduces feature dimensionality without compromising accuracy. The integration of PCA significantly reduces training time to 9.46 seconds and prediction time to 0.05 seconds while maintaining a 100% classification accuracy rate. These results highlight the efficacy of our methodology in efficiently classifying MPs. Combining machine learning and fluorescence spectroscopy, our research provides a promising solution to the pressing challenge of monitoring MP contamination.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Zhijian Liu, Lanjun Sun, Xiongfei Meng, Fanyi Kong, and Han Zhang "PCA combined with SVM assisted fluorescence spectroscopy for classification of microplastics", Proc. SPIE 13183, International Conference on Optoelectronic Information and Functional Materials (OIFM 2024), 131830P (5 July 2024); https://doi.org/10.1117/12.3033871
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KEYWORDS
Principal component analysis

Fluorescence spectroscopy

Machine learning

Spectroscopy

Fluorescence

Detection and tracking algorithms

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