Open Access Paper
12 November 2024 A coarse-to-fine framework with ordinal regression for facial age estimation
Yongfeng Yan, Wenhao Li, Lulu Zhao, Wanyong Tian, Zheng Tang, Guobao Hui, Yin Ye, Jianjun Li
Author Affiliations +
Proceedings Volume 13395, International Conference on Optics, Electronics, and Communication Engineering (OECE 2024) ; 1339531 (2024) https://doi.org/10.1117/12.3049387
Event: International Conference on Optics, Electronics, and Communication Engineering, 2024, Wuhan, China
Abstract
This study introduces a novel coarse-to-fine framework combined with ranking regression designed to capture the ordinal nature of age progression. Our approach initially categorizes ages into broader groups, utilizing the inherent order of age labels to refine age estimation hierarchically. A ranking regression model then meticulously fine-tunes the predictions, resulting in a more accurate age estimate. We present a multi-stage neural network architecture that first differentiates between broad age categories and then hones in on more specific age distinctions. Our evaluation of multiple benchmark datasets indicates a substantial reduction in prediction error over current leading models. The empirical findings highlight the effectiveness of our methodology in addressing the complex, non-linear patterns of facial aging. The proposed method propels the domain of age estimation forward and provides a versatile framework for other ordinal regression tasks.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yongfeng Yan, Wenhao Li, Lulu Zhao, Wanyong Tian, Zheng Tang, Guobao Hui, Yin Ye, and Jianjun Li "A coarse-to-fine framework with ordinal regression for facial age estimation", Proc. SPIE 13395, International Conference on Optics, Electronics, and Communication Engineering (OECE 2024) , 1339531 (12 November 2024); https://doi.org/10.1117/12.3049387
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Education and training

Binary data

Machine learning

Performance modeling

Ablation

Error analysis

RGB color model

Back to Top