Dual-wavelength differential confocal sensing technology with virtual pinhole detection

Chao Liu; Jun Li; Yuhao Wang; Jingyi Xun

doi:10.1117/12.3053385

18 November 2024 Dual-wavelength differential confocal sensing technology with virtual pinhole detection

Chao Liu, Jun Li, Yuhao Wang, Jingyi Xun

Proceedings Volume 13417, International Conference on Precision Instruments and Optical Engineering (PIOE 2024); 134170C (2024) https://doi.org/10.1117/12.3053385
Event: 4th International Conference on Precision Instruments and Optical Engineering (PIOE 2024), 2024, Kuala Lumpur, Malaysia

Abstract

Aiming at the problem that when combining confocal microscopy and resonance Raman spectroscopy (RRS), the focusing accuracy of the system decreases due to the shift of the focusing plane of the beam caused by the change of the work wavelength, a laser dual-wavelength differential confocal sensing technology (DDCST) with virtual pinhole and CCD detection is proposed, the basic theory based on the wavelength and focusing plane position relationship has been established, which can provide a precise theoretical basis for the determination of the focusing accuracy of the Confocal microscopy (CM)-RRS, and greatly improve the system accuracy, and uses a CCD as detector. DDCST sets a microregion on the CCD imaging plane as a virtual pinhole, can freely adjust the position and size of the pinhole in the software to match with the sample reflectivity and detector response range in measurements. So, DDCST significantly simplifies the detection system and pinhole adjustment, eliminates the error attributed to the adjustment error of the physical pinhole. Theoretical analyses and preliminary experiments indicate that DDCST has an axial resolution of about 5nm and 6nm respectively, and a lateral resolution of about 1µm and 1.2µm respectively when the work wavelength is 532nm and 653nm respectively, can recognizes the influence of the change of the work wavelength on the focusing accuracy of the system, which can lay the foundation of the morphology imaging of the probing micro-region, and provide theoretical support and help for the development of the CM-RRS.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Chao Liu, Jun Li, Yuhao Wang, and Jingyi Xun "Dual-wavelength differential confocal sensing technology with virtual pinhole detection", Proc. SPIE 13417, International Conference on Precision Instruments and Optical Engineering (PIOE 2024), 134170C (18 November 2024); https://doi.org/10.1117/12.3053385

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Confocal microscopy

Sensors

Raman spectroscopy

Charge-coupled devices

Objectives

CCD image sensors

Curium

Show All Keywords

Keywords/Phrases

Search In:

Publication Years