Checking the surface resistance of ordinary EMI-shielding foil at millimeter-wave frequencies using a simple quasioptical technique

Udo B. Unrau

doi:10.1117/12.2301449

1 December 1990 Checking the surface resistance of ordinary EMI-shielding foil at millimeter-wave frequencies using a simple quasioptical technique

Udo B. Unrau

Author Affiliations +

Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151413 (1990) https://doi.org/10.1117/12.2301449
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States

Abstract

For a variety of electromagnetic shielding applications mass-produced absorbing foil is available of which only D.C. surface resistance data are blown. Using a simple quasioptical arrangement die data at mm-wave frequencies are derived from reflection minima and the approximately known dielectric properties of the basis material. The range of validity of the measurement is discussed. Data for carbon- filled polycarbonate and indium-tin-oxide-coated PET foil are given.

Citation Download Citation

Udo B. Unrau "Checking the surface resistance of ordinary EMI-shielding foil at millimeter-wave frequencies using a simple quasioptical technique", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151413 (1 December 1990); https://doi.org/10.1117/12.2301449

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