Paper
1 November 1991 Determination of optical constants of thin film in the soft x-ray region
Yong Hong Guo, Zhengxiu Fan, Ouyang Bin, Lei Jin, Jian-Da Shao
Author Affiliations +
Proceedings Volume 1519, International Conference on Thin Film Physics and Applications; (1991) https://doi.org/10.1117/12.47246
Event: International Conference on Thin Film Physics and Applications, 1991, Shanghai, China
Abstract
We presented a method of determining optical constants of a thin film using the reflectance R(theta) curve. Other parameters of the film, such as film thickness and roughness, are also determined with the derivation of the optical constants(n,k). To illustrate the method, the results of the film Al are given.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yong Hong Guo, Zhengxiu Fan, Ouyang Bin, Lei Jin, and Jian-Da Shao "Determination of optical constants of thin film in the soft x-ray region", Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); https://doi.org/10.1117/12.47246
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KEYWORDS
Reflectivity

Thin films

X-rays

Aluminum

Inverse optics

Optical testing

Physics

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