Experimental characterization of Fresnel zone plate for hard x-ray applications

Barry P. Lai; John J. Chrzas; Wenbing Yun; Dan G. Legnini; P. James Viccaro; Richard M. Bionta; Kenneth M. Skulina

doi:10.1117/12.49466

1 November 1991 Experimental characterization of Fresnel zone plate for hard x-ray applications

Barry P. Lai, John J. Chrzas, Wenbing Yun, Dan G. Legnini, P. James Viccaro, Richard M. Bionta, Kenneth M. Skulina

Proceedings Volume 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments; (1991) https://doi.org/10.1117/12.49466
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

A series of experimental measurements was conducted for the characterization of a transmission circular zone plate. The zone plate (ZP), with a primary focal length of 40 cm for 8 keV photons, was illuminated by monochromatized synchrotron x rays. Focusing efficiency of the ZP was measured as a function of x-ray energy between 5 - 1 keV, from which the ZP thickness was determined. Focal spot sizes at the first, second, and third order focus were measured, and they agreed very well with the calculated values. Images of a 1000 mesh/inch gold grid were also obtained at the three focal planes. The grid scans indicated that the spatial resolution is about 2 (mu) in the image obtained at the third order focus.

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Barry P. Lai, John J. Chrzas, Wenbing Yun, Dan G. Legnini, P. James Viccaro, Richard M. Bionta, and Kenneth M. Skulina "Experimental characterization of Fresnel zone plate for hard x-ray applications", Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); https://doi.org/10.1117/12.49466

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