Paper
1 March 1992 Applications of step-scan FTIR photoacoustic depth profiling
Rebecca M. Dittmar, Richard Alan Palmer, James L. Chao
Author Affiliations +
Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56297
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany
Abstract
The use of step-scan Fourier transform infrared (FT-IR) spectroscopy combined with photoacoustic (PA) detection is used to depth profile laminated polymeric materials. Depth profiling can be performed using a combination of the modulation frequency dependence and phase lag of the PA signal.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rebecca M. Dittmar, Richard Alan Palmer, and James L. Chao "Applications of step-scan FTIR photoacoustic depth profiling", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); https://doi.org/10.1117/12.56297
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KEYWORDS
Fourier transforms

Modulation

Phase shift keying

Profiling

Photoacoustic spectroscopy

FT-IR spectroscopy

Infrared spectroscopy

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