Paper
1 March 1992 FTIR-ATR evaluation of topical skin protectants useful for sulfur mustard and related compounds
Ernest H. Braue Jr., Marty R. Litchfield, Catherine R. Bangledorf, Robert G. Rieder
Author Affiliations +
Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56437
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany
Abstract
The US Army has a need to develop topical protectants that can decrease the effects of cutaneous exposure to chemical warfare (CW) agents. Such materials would enhance a soldier's ability to carry out the mission in a chemically hostile environment, would lessen the burden on medical personnel, and may allow the casualties to return to duty in a shorter period of time than might otherwise be possible. In a preliminary report (E. H. Braue, Jr. and M. G. Pannella, Applied Spectrosc., 44, 1061 (1990)), we described a unique analytical method using FT-IR spectroscopy and the horizontal attenuated total reflectance (ATR) accessory for evaluating the effectiveness of topical skin protectants (TSPs) against penetration by chemical agents. We now describe the application of this method to the chemical warfare agent sulfur mustard (HD).
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ernest H. Braue Jr., Marty R. Litchfield, Catherine R. Bangledorf, and Robert G. Rieder "FTIR-ATR evaluation of topical skin protectants useful for sulfur mustard and related compounds", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); https://doi.org/10.1117/12.56437
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KEYWORDS
Attenuated total reflectance

Skin

Blistering agents

Diffusion

FT-IR spectroscopy

Crystals

Spectroscopy

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