Paper
1 February 1994 Characterization of imaging normal-incidence multilayer mirrors for the 40- to 300-Å range by spectroscopic techniques using a laser-plasma radiation source
Eugene N. Ragozin, Nikolai N. Kolachevsky, Mikhail M. Mitropolsky, Vladimir A. Slemzin, Nikolai N. Salashchenko
Author Affiliations +
Abstract
A number of high-performance normal-incidence multilayer mirrors (MMs) have been fabricated on concave (r equals 1.6 - 2.0 m) fused silica substrates using laser deposition and a magnetron ion sputtering source. The resonance wavelengths (lambda) 0 equals 2nd of the MMs synthesized are proximate to 45, 130, 175, 190, and 304 angstroms. The MMs have been subjected to scrutiny by a spectroscopic technique employing a laser-plasma broadband XUV radiation source. The spectral shapes of the resonance reflection curves, the (lambda) 0 values, and the aperture uniformity (topography) of the mirrors have been determined spectroscopically. Normal-incidence reflection maxima, which correspond to higher-order reflection (k(lambda) equals 2n(lambda )d, k > 1), have been observed for all of the Mo-Si MMs with (lambda) >= 175 angstroms.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugene N. Ragozin, Nikolai N. Kolachevsky, Mikhail M. Mitropolsky, Vladimir A. Slemzin, and Nikolai N. Salashchenko "Characterization of imaging normal-incidence multilayer mirrors for the 40- to 300-Å range by spectroscopic techniques using a laser-plasma radiation source", Proc. SPIE 2012, Ultrashort Wavelength Lasers II, (1 February 1994); https://doi.org/10.1117/12.167387
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Cited by 5 scholarly publications.
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KEYWORDS
Spectroscopy

Mirrors

Plasma

Reflection

Imaging spectroscopy

Extreme ultraviolet

Ions

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