Paper
31 January 1994 Study of reactions in the gaseous phase during SiC-layers deposition by CVD method
Czeslawa Paluszkiewicz, S. Jonas, W. S. Ptak, W. Sadowski
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166723
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
The present work contains preliminary results of investigations of the gaseous phase composition in the course of preparation of SiC layers. The layers were deposited by decomposition of CH3SiCl3 diluted in the Ar stream during CVD process. FTIR spectra of the gaseous phase were recorded using a special reaction cell, at short time intervals and at various temperatures ranging from 300 K to 1200 K. Transition products of the reaction in the gas phase (SiCl4 and CH4 molecules) were observed at higher temperatures. The final product of the reaction, in the gaseous phase, i.e., HCl, was also detected.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Czeslawa Paluszkiewicz, S. Jonas, W. S. Ptak, and W. Sadowski "Study of reactions in the gaseous phase during SiC-layers deposition by CVD method", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166723
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KEYWORDS
Chemical vapor deposition

FT-IR spectroscopy

Silicon

Argon

Molecules

Silicon carbide

Chlorine

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