PROCEEDINGS VOLUME 2183
IS&T/SPIE 1994 INTERNATIONAL SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | 6-10 FEBRUARY 1994
Machine Vision Applications in Industrial Inspection II
Editor(s): Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu
Editor Affiliations +
IS&T/SPIE 1994 INTERNATIONAL SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY
6-10 February 1994
San Jose, CA, United States
2D Pattern Inspection I: Periodic Patterns
Thierry Thomas, Michel Cattoen
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171200
Babak H. Khalaj, Hamid K. Aghajan, Arogyaswami Paulraj, Thomas Kailath
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171210
2D Pattern Inspection II
Byron E. Dom, Wolf-Ekkehard Blanz, Charles Cox, David Ashby Steele, Alan D. Dorundo
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171223
Alan D. Dorundo, Jon R. Mandeville, Frederick Y. Wu
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171224
Paul A. Roder
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171225
Gary P Brown, Peter Forte, Ron Malyan, Peter Barnwell
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171226
2D Pattern Inspection III
Byron E. Dom, David Ashby Steele, Richard Krebs, David R. Kiehl, Patrick Saldanha, Eric K. Wong, John W. Moffitt, Dragutin Petkovic, John Herber, et al.
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171227
Gerfried Zeichen, Herbert Hufnagl, M. Berger
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171228
Thomas L. Arnow, Juyong Qiu, Harold G. Longbotham
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171201
2D Pattern Inspection IV: Defect Classification
John W. Morris, Joseph Notarangelo
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171202
Moritoshi Ando, Hideo Okada, Yoshikazu Kakinoki
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171203
Graham B. Finney, J. B. Gomm, D. Williams, John T. Atkinson
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171204
J. Huart, Jack-Gerard Postaire
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171205
Michel Canivet, Ruo Dan Zhang, Michel Jourlin
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171206
Texture Methods
D. K. Sharma, B. Veerabhadra Rao
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171207
K. Y. Song, Josef Kittler, Maria Petrou, I. Ng
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171208
Cor L. Claeys, Ingrid Debusschere, Nico Ricquier, Peter Seitz, Martin Stalder, Jeffrey M. Raynor, Graham K. Lang, Giuseppe Cilia, C. Cavanna, et al.
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171209
Dragana P. Brzakovic, Hamed Sari-Sarraf
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171211
3D Methods I
Adrian Hilton, Andrew J. Stoddart, John Illingworth, Terry Windeatt
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171212
Jeremy David Pearson, Francis Lilley, David R. Burton, John T. Atkinson, Shirish P. Kshirsagar, David J. Search, Clifford Allan Hobson
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171213
3D Methods II
Yoshinori Hatanaka, Yasushi Kobayashi, Hidetoshi Takahashi
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171214
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171215
H. Keith Nishihara, Hans J. Thomas, Eric L. Huber
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171216
Sergio Cuniolo, Michele Maini, Massimo Savini, Andrea Scianna
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171217
Real-Time Tracking
Tse-Chung Wei, Murali Subbarao
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171218
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171219
Fritz M. Rothacher, Norbert Felber, Hubert Kaeslin
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171220
Nasser Sherkat, Mike S. Birch, Peter D. Thomas
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171221
2D Pattern Inspection IV: Defect Classification
David J. Search, Clifford Allan Hobson, John T. Atkinson, Jeremy David Pearson
Proceedings Volume Machine Vision Applications in Industrial Inspection II, (1994) https://doi.org/10.1117/12.171222
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