PROCEEDINGS VOLUME 2183
IS&T/SPIE 1994 INTERNATIONAL SYMPOSIUM ON ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | 6-10 FEBRUARY 1994
Machine Vision Applications in Industrial Inspection II
Editor(s): Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu
Editor Affiliations +
Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu