Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies

David J. Search; Clifford Allan Hobson; John T. Atkinson; Jeremy David Pearson

doi:10.1117/12.171222

11 March 1994 Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies

David J. Search, Clifford Allan Hobson, John T. Atkinson, Jeremy David Pearson

Proceedings Volume 2183, Machine Vision Applications in Industrial Inspection II; (1994) https://doi.org/10.1117/12.171222
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States

Abstract

A technique for the quality assessment of fine-pitch electronic components is described. A system for the capture of Fraunhofer diffraction patterns reflected from the component is presented. The processing of the image to enable classification by a neural network is discussed. Simulation results are presented, showing the feasibility of the technique.

Citation Download Citation

David J. Search, Clifford Allan Hobson, John T. Atkinson, and Jeremy David Pearson "Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); https://doi.org/10.1117/12.171222

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