Optoelectronic shearography: two wavelength slope measurement

J.-R. Huang; Ralph P. Tatam

doi:10.1117/12.211869

14 June 1995 Optoelectronic shearography: two wavelength slope measurement

J.-R. Huang, Ralph P. Tatam

Author Affiliations +

Proceedings Volume 2544, Interferometry VII: Techniques and Analysis; (1995) https://doi.org/10.1117/12.211869
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

A technique for the slope measurement of objects by using an electronic shearography system is presented. To detect the gradients of an object shape, a laser diode is modulated to produce two wavelengths on successive image frames. These two frames are then subtracted to generate the correlation fringes which depict the slope variation. The theory of this technique is derived and objects of conical, cylindrical, and spherical shapes are measured. Experimental results are demonstrated.

Citation Download Citation

J.-R. Huang and Ralph P. Tatam "Optoelectronic shearography: two wavelength slope measurement", Proc. SPIE 2544, Interferometry VII: Techniques and Analysis, (14 June 1995); https://doi.org/10.1117/12.211869

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