Trial manufacturing results and characteristics of InGaAs-quadrant detectors (QD) as a fine pointing sensor

Tomohiro Araki; Mamoru Furuya; Yasumasa Hisada

doi:10.1117/12.273692

24 April 1997 Trial manufacturing results and characteristics of InGaAs-quadrant detectors (QD) as a fine pointing sensor

Tomohiro Araki, Mamoru Furuya, Yasumasa Hisada

Author Affiliations +

Proceedings Volume 2990, Free-Space Laser Communication Technologies IX; (1997) https://doi.org/10.1117/12.273692
Event: Photonics West '97, 1997, San Jose, CA, United States

Abstract

We would like to report our research and development on InGaAs-QD as a part of our research on optical inter-orbit communication technology. Optical transmitter subsystems using Erbium doped fiber amplifier (EDFA, wavelength 1550nm) and Neodymium doped fiber amplifier (NDFA, wavelength 1060nm) have been candidate subsystems of future optical-IOC system. However, present fine pointing sensors, such as Si- QD and Si-CCD, have little sensitivity at 1060nm, and no sensitivity at wavelengths longer than 1100nm. There is a need for a fine pointing sensor that has a high sensitivity at 1060nm and 1550 nm. Thus, we tried to manufacture InGaAs- pin-QD, adding optical surface separation processes into conventional production processes of commercially available InGaAs-pin-PD. InGaAs-QD with high sensitivity and low dark current was produced. Our analysis shows that these devices are suitable as a fine pointing sensor of optical-IOC systems using EDFA or NDFA as a transmitter subsystem.

Citation Download Citation

Tomohiro Araki, Mamoru Furuya, and Yasumasa Hisada "Trial manufacturing results and characteristics of InGaAs-quadrant detectors (QD) as a fine pointing sensor", Proc. SPIE 2990, Free-Space Laser Communication Technologies IX, (24 April 1997); https://doi.org/10.1117/12.273692

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