Paper
30 July 1997 Optical properties of phase-change materials for optical recording
Jean Michel Bruneau, Bernard Bechevet, B. Valon, M. F. Armand
Author Affiliations +
Proceedings Volume 3109, Optical Data Storage 1997 Topical Meeting; (1997) https://doi.org/10.1117/12.280692
Event: Optical Data Storage Topical Meeting '97, 1997, Tucson, AZ, United States
Abstract
Optical properties of three different phase change alloys (GeSbTe, InSbTe and AgInSbTe) are measured and compared. The experimental results are used to compute properties of multilayer stacks for phase change recording.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean Michel Bruneau, Bernard Bechevet, B. Valon, and M. F. Armand "Optical properties of phase-change materials for optical recording", Proc. SPIE 3109, Optical Data Storage 1997 Topical Meeting, (30 July 1997); https://doi.org/10.1117/12.280692
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Cited by 3 scholarly publications.
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KEYWORDS
Reflectivity

Refractive index

Optical properties

Crystals

Dielectrics

Germanium antimony tellurium

Optical recording

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