Imaging pyrometry of oxides

Michael E. Thomas; Patrick S. Wayland; David H. Terry

doi:10.1117/12.304720

26 March 1998 Imaging pyrometry of oxides

Michael E. Thomas, Patrick S. Wayland, David H. Terry

Author Affiliations +

Proceedings Volume 3361, Thermosense XX; (1998) https://doi.org/10.1117/12.304720
Event: Aerospace/Defense Sensing and Controls, 1998, Orlando, FL, United States

Abstract

A technique for imaging pyrometry of oxides will be presented which is capable of remotely determining the temperatures of an oxide surface with useful accuracy. The technique relies on the near-blackbody emittance properties of most oxides in the two-phonon spectral region. Most oxides in the longwave IR region are very highly emitting with an emittance that is almost temperature independent and Lambertian. We present a generalized calibration procedure for longwave cameras that allows spatially resolved surface temperature to be obtained from radiance measurements. Experimental results from a sapphire disk will be presented as a demonstration of the technique.

Citation Download Citation

Michael E. Thomas, Patrick S. Wayland, and David H. Terry "Imaging pyrometry of oxides", Proc. SPIE 3361, Thermosense XX, (26 March 1998); https://doi.org/10.1117/12.304720

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