Multistepped x-ray crystal diffractor based on a pseudospherical geometry

Augusto Marcelli; M. I. Mazuritsky; Alexander V. Soldatov

doi:10.1117/12.332508

11 December 1998 Multistepped x-ray crystal diffractor based on a pseudospherical geometry

Augusto Marcelli, M. I. Mazuritsky, Alexander V. Soldatov

Proceedings Volume 3448, Crystal and Multilayer Optics; (1998) https://doi.org/10.1117/12.332508
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

A new type of x-ray focusing crystal diffractor based on a pseudo-spherical stepped geometry is presented. This device is a particular stepped surface, where each element is a spherically bent rectangular crystal, whose reflecting planes are parallel to the surface and oriented so as to fulfill the Bragg condition. The area of each surface element (step) is chosen such as to define the same solid angle. Theoretical parameters and performances of a high resolution Multi-Stepped Monochromator (MSM) based on this geometry are estimated for some typical applications. To this aim, an original approach that allows to determine the Bragg reflection area of each element has been developed and applied both to spherical and pseudo-spherical diffractors. The calculations indicate that the gain of the proposed optical design is significantly enhanced as compared to the best crystal devices bi- dimensionally focusing. In particular in the high resolution conditions, the gain in spectral throughput of a MSM device is about one order of magnitude, with respect a conventional one.

Citation Download Citation

Augusto Marcelli, M. I. Mazuritsky, and Alexander V. Soldatov "Multistepped x-ray crystal diffractor based on a pseudospherical geometry", Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); https://doi.org/10.1117/12.332508

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