Paper
6 July 1999 Stark width measurement of several OII lines
Juan Antonio del Val, Juan Antonio Aparicio-Calzada, Santiago Mar Sardana
Author Affiliations +
Proceedings Volume 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications; (1999) https://doi.org/10.1117/12.358431
Event: 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, 1998, Cartagena de Indias, Colombia
Abstract
Stark widths of 28 OII spectral lines have been measured as functions of electron density in a pulsed discharge plasma. The electron density, which ranges from 1 to 8 X 1022 m-3 in the plasma, has been determined simultaneously by one-wavelength interferometry, using the 514.0 nm transition of an Argon ion laser, and from Balmer- alpha Stark broadening. The OII excitation temperature (22000 - 48000 K) has been determined from Boltzmann-plots. The measured data are compared with other works found in the literature.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juan Antonio del Val, Juan Antonio Aparicio-Calzada, and Santiago Mar Sardana "Stark width measurement of several OII lines", Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); https://doi.org/10.1117/12.358431
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KEYWORDS
Plasma

Interferometry

Spectroscopy

Argon ion lasers

Neon

Calibration

Diagnostics

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