Paper
19 August 1998 Laser polarization superresolution in surface microscopy
Author Affiliations +
Proceedings Volume 3573, OPTIKA '98: 5th Congress on Modern Optics; (1998) https://doi.org/10.1117/12.324575
Event: OPTIKA '98: Fifth Congress on Modern Optics, 1998, Budapest, Hungary
Abstract
New possibilities for measurement of slightly-rough surfaces provided by usage of polarization optics in modern interference measuring devices are considered.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oleg V. Angelsky, Alexander G. Ushenko, and Serhiy B. Yermolenko "Laser polarization superresolution in surface microscopy", Proc. SPIE 3573, OPTIKA '98: 5th Congress on Modern Optics, (19 August 1998); https://doi.org/10.1117/12.324575
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KEYWORDS
Polarization

Super resolution

Measurement devices

Microscopy

Interferometers

Objectives

Optical spheres

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