Fabrication and characterization of high-speed integrated electro-optic lens and scanner devices

Kevin T. Gahagan; Venkatraman Gopalan; Jeanne M. Robinson; Quanxi Jia; T. E. Mitchell; Matthew J. Kawas; Tuviah E. Schlesinger; Daniel D. Stancil

doi:10.1117/12.343750

26 March 1999 Fabrication and characterization of high-speed integrated electro-optic lens and scanner devices

Kevin T. Gahagan, Venkatraman Gopalan, Jeanne M. Robinson, Quanxi Jia, T. E. Mitchell, Matthew J. Kawas, Tuviah E. Schlesinger, Daniel D. Stancil

Author Affiliations +

Proceedings Volume 3620, Integrated Optics Devices III; (1999) https://doi.org/10.1117/12.343750
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

We demonstrate two high-speed electro-optic devices: an integrated lens/scanner and a variable radius collimating lens stack fabricated on a single crystal of Z-cut LiTaO₃. The lens and scanner components consist of lithographically defined domain-inverted regions extending through the thickness of the crystal. A lens power of 0.233 cm^-1kV^-1, a deflection angle of 12.68 mrad kV^-1, and a scan rate of 225 kHz at 375 V were observed. The collimating lens stack is theoretically capable of collimating the output from 2 - 10 micron diameter channel waveguides.

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Kevin T. Gahagan, Venkatraman Gopalan, Jeanne M. Robinson, Quanxi Jia, T. E. Mitchell, Matthew J. Kawas, Tuviah E. Schlesinger, and Daniel D. Stancil "Fabrication and characterization of high-speed integrated electro-optic lens and scanner devices", Proc. SPIE 3620, Integrated Optics Devices III, (26 March 1999); https://doi.org/10.1117/12.343750

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