Paper
28 May 1999 New multilinear solid state detector for digital slot scan radiography
Bernard Munier, Roland Sottoriva, Paul M. de Groot
Author Affiliations +
Abstract
A novel solid state detector has been developed for digital radiography. It is based on an assembly of CCD chips operated in TDI mode. The X-ray detection is achieved by a CsI scintillator layer which features a needle structure. It combines an excellent resolution with a high absorption efficiency. The detector is able to operate in 2 modes: a standard resolution mode and a high resolution mode. In the standard mode, the detector features a 440 mm long sensitive area and a 162 micrometer pixel size. The total number of pixels along detector direction is 2720. Along the scan direction, the detector features a 10.8 mm wide sensitive area. A TDI process is performed in the chip itself over 67 X- ray sensitive elements. A 440 mm X 440 mm sized image can be acquired in typically 1.2 second. The high resolution mode allows producing images with an 81 micrometer pixel size. The detection dynamic range is 10,000:1. The main performance characteristics of the detector are presented, such as DQE, MTF, dynamic range.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernard Munier, Roland Sottoriva, and Paul M. de Groot "New multilinear solid state detector for digital slot scan radiography", Proc. SPIE 3659, Medical Imaging 1999: Physics of Medical Imaging, (28 May 1999); https://doi.org/10.1117/12.349506
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Sensors

X-rays

Modulation transfer functions

Charge-coupled devices

Solid state electronics

Radiography

X-ray detectors

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