Experience with EFQM assessment at Siemens Mask Shop

Werner Reindl; Siegfried Steuber

doi:10.1117/12.346221

23 April 1999 Experience with EFQM assessment at Siemens Mask Shop

Werner Reindl, Siegfried Steuber

Proceedings Volume 3665, 15th European Conference on Mask Technology for Integrated Circuits and Microcomponents '98; (1999) https://doi.org/10.1117/12.346221
Event: 15th European Conference on Mask Technology for Integrated Circuits and Micro-Components, 1998, Munich, Germany

Abstract

The EFQM Management Self-Assessment was applied to mask manufacturing and was found to be the driving process for business improvements at the mask shop. It offered an opportunity to learn about the organisation's strengths and especially the areas where improvement was necessary.

Citation Download Citation

Werner Reindl and Siegfried Steuber "Experience with EFQM assessment at Siemens Mask Shop", Proc. SPIE 3665, 15th European Conference on Mask Technology for Integrated Circuits and Microcomponents '98, (23 April 1999); https://doi.org/10.1117/12.346221

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