Physically based infrared sensor effects modeling

Christelle Garnier; Rene Collorec; Jihed Flifla; Christophe Mouclier; Frank Rousee

doi:10.1117/12.352990

12 July 1999 Physically based infrared sensor effects modeling

Christelle Garnier, Rene Collorec, Jihed Flifla, Christophe Mouclier, Frank Rousee

Proceedings Volume 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X; (1999) https://doi.org/10.1117/12.352990
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

This paper describes an IR sensor model for realistic thermal image synthesis. The model accurately computes the image of a scene provided by an IR sensor, given the incoming radiance from the scene and a number of sensor parameters. This is accomplished by a new modeling approach which allows implementation of computations in better accordance with sensor physics. First thermal flux received by IR sensor detector areas is computed using ray tracing. This implies that the path followed by thermal radiation is retraced through the IR sensor and that sampling is implemented in spatial, spectral and temporal dimensions. Then the conversion of thermal flux into electrical signal is reproduced. This IR sensor model is an improvement over standard IR sensor models. It can account more accurately for many sensor effects: spatial and temporal sampling of the image plane by the detector area, wavelength dependent effects, especially in optical transmittance and detector responsivity, spatially variant effects, such as aberrations and distribution of irradiance on the image plane, and motion of objects in the scene. It can also take into account several other phenomena which are not usually simulated: modification of the distance between optics and detector plane during focusing, geometric distortion and depth of field limitation.

Citation Download Citation

Christelle Garnier, Rene Collorec, Jihed Flifla, Christophe Mouclier, and Frank Rousee "Physically based infrared sensor effects modeling", Proc. SPIE 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, (12 July 1999); https://doi.org/10.1117/12.352990

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