Paper
5 July 2000 Comparison of ArF and KrF laser performance at 2 kHz for microlithography
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Abstract
Exposure tools for 193nm lithography are expected to use Argon-Fluoride lasers at repetition rates of at least 2kHz. We are showing that, by revisiting several key technologies, the performance and reliability of ArF lasers at 2 kHz are trending towards a level comparable to KrF lasers.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Herve Besaucele, Palash P. Das, Thomas P. Duffey, Todd J. Embree, Alexander I. Ershov, Vladimir B. Fleurov, Steven L. Grove, Paul C. Melcher, Richard M. Ness, and Gunasiri G. Padmabandu "Comparison of ArF and KrF laser performance at 2 kHz for microlithography", Proc. SPIE 4000, Optical Microlithography XIII, (5 July 2000); https://doi.org/10.1117/12.388986
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Cited by 1 scholarly publication.
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KEYWORDS
Optical lithography

Sensors

193nm lithography

Pulsed power

Control systems

Fabry–Perot interferometers

Laser applications

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