Paper
24 October 2001 Near-field Mie scattering in optical trap nanometry
Djenan Ganic, Xiasong Gan, Min Gu
Author Affiliations +
Abstract
A mathematical model for understanding near-field Mie scattering, as used in optical trap nanomery for single molecule detection, is developed. Both perpendicular and parallel polarization states of incident electromagnetic waves have been considered. Simulations under different incident angles, and refractive indices of trapped particle have been investigated. Half-space signal strength is studied on the base of the calculated three-dimensional scattered electromagnetic field.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Djenan Ganic, Xiasong Gan, and Min Gu "Near-field Mie scattering in optical trap nanometry", Proc. SPIE 4434, Hybrid and Novel Imaging and New Optical Instrumentation for Biomedical Applications, (24 October 2001); https://doi.org/10.1117/12.446673
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KEYWORDS
Particles

Near field

Mie scattering

Refractive index

Dielectric polarization

Dielectrics

Optical tweezers

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