Statistical properties of x-ray CT and MRI: from imaging physics to image statistics

Tianhu Lei; Jayaram K. Udupa

doi:10.1117/12.465626

3 May 2002 Statistical properties of x-ray CT and MRI: from imaging physics to image statistics

Tianhu Lei, Jayaram K. Udupa

Proceedings Volume 4682, Medical Imaging 2002: Physics of Medical Imaging; (2002) https://doi.org/10.1117/12.465626
Event: Medical Imaging 2002, 2002, San Diego, California, United States

Abstract

Physical and mathematical procedures of x-ray CT and MRI have been extensively studied during the past three decades. The statistical methods of image reconstruction, processing and analysis of x-ray CT and MRI have been widely used in the various fields. However, the lack of a complete description and a rigorous proof of their statistical properties become a common concern. This study attempts to fill this gap and discusses a framework for studying the statistical aspects of x-ray CT and MRI.

Citation Download Citation

Tianhu Lei and Jayaram K. Udupa "Statistical properties of x-ray CT and MRI: from imaging physics to image statistics", Proc. SPIE 4682, Medical Imaging 2002: Physics of Medical Imaging, (3 May 2002); https://doi.org/10.1117/12.465626

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