Optically Controlled Millimeter-Wave Devices

A. M. Vaucher; M. G. Li; C. D. Striffler; C. H. Lee

doi:10.1117/12.942622

1 November 1987 Optically Controlled Millimeter-Wave Devices

A. M. Vaucher, M. G. Li, C. D. Striffler, C. H. Lee

Proceedings Volume 0477, Optical Technology for Microwave Applications I; (1987) https://doi.org/10.1117/12.942622
Event: 1984 Technical Symposium East, 1984, Arlington, United States

Abstract

A dynamic bridge method has been developed to measure the time varying phase shift and attenuation of millimeter-waves in semiconductor waveguides when perturbed by optically induced plasmas. The resolution of this technique is 2 ns in real time. Comparison of this method with a theoretical model is also discussed.

Citation Download Citation

A. M. Vaucher, M. G. Li, C. D. Striffler, and C. H. Lee "Optically Controlled Millimeter-Wave Devices", Proc. SPIE 0477, Optical Technology for Microwave Applications I, (1 November 1987); https://doi.org/10.1117/12.942622

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