PROCEEDINGS VOLUME 4778
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 7-11 JULY 2002
Interferometry XI: Applications
Editor(s): Wolfgang Osten
Editor Affiliations +
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
7-11 July 2002
Seattle, WA, United States
Optical Inspection of Microcomponents
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473541
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473551
Fei Su, Lie Liu, Sung Yi, Kerm Sin Chian
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473561
Leszek A. Salbut, Agata Jozwicka, Pawel Dymerski, Michal Jozwik
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473569
Three-Dimensional Shape Measurement
Malgorzata Kujawinska, Robert Sitnik, Michal Emanuel Pawlowski, Piotr Garbat, Marek Grzegorz Wegiel
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473572
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473573
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473574
Gottfried Frankowski, Mai Chen, Torsten Huth
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473575
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473532
High-Precision Surface Metrology
Ingolf Weingaertner, Michael Schulz
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473533
Tae-hee Kim, James H. Burge, Yun Woo Lee
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473534
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473535
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473536
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473537
Optical Shop Testing
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473538
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473539
Stephan Reichelt, Christof Pruss, Hans J. Tiziani
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473540
Distance, Displacement, and Vibration Measurement
Ichirou Yamaguchi, Jun-ichi Kato, Hirokazu Matsuzaki
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473542
Jong-Ryul Lee, Jerume Molimard, Alain Vautrin, Yves Surrel
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473543
Optical Shop Testing
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473544
Distance, Displacement, and Vibration Measurement
Zongtao Ge, Mitsuo Takeda
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473545
Industrial Inspection
Fang Chen, Mitchell M. Marchi, Thomas E. Allen
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473546
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473547
Enrique de la Rosa Miranda, Luis R. Berriel-Valdos, Marcelo Funes-Gallanzi, S. A. Fernandez Orozco
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473548
Ming Wang, Shouping Nie, Dacheng Li
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473549
Guenther K.G. Wernicke, Sven Krueger, Frank Kallmeyer, Hartmut Gruber, Nazif Demoli, Matthias Duerr, Alexander Steinhoff
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473550
Toshiharu Mizukaki, Harald Kleine, Kazuyoshi Takayama
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473552
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473553
Optical Shop Testing
Ingolf Weingaertner, Michael Schulz, Clemens Elster, Joachim Gerhardt, Axel Lucas
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473554
Distance, Displacement, and Vibration Measurement
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473555
Wei Tao, Zhaobang Pu, Zhuo Zhang
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473556
Three-Dimensional Shape Measurement
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473557
High-Precision Surface Metrology
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473558
Three-Dimensional Shape Measurement
Fritz Zoellner, Vladislav Matusevich, Richard M. Kowarschik
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473559
Optical Shop Testing
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473560
High-Precision Surface Metrology
Stephan Reichelt, Christof Pruss, Hans J. Tiziani
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473562
Optical Shop Testing
Gennadi M. Popov, Yevgen G. Popov
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473563
Three-Dimensional Shape Measurement
Jingang Zhong, Jing Zhao
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473564
High-Precision Surface Metrology
Henryk T. Kasprzak, Jaroslaw W. Jaronski
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473565
Optical Shop Testing
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473566
Industrial Inspection
Lijuan Li, Zhiyong An, Lixia Shi, Haibo Zhu
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473567
Igor Victorovic Ershov, Yuriy D. Babichev
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473568
Distance, Displacement, and Vibration Measurement
Irina V. Semenova, Galina V. Dreiden, Alexander M. Samsonov
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473570
Industrial Inspection
Proceedings Volume Interferometry XI: Applications, (2002) https://doi.org/10.1117/12.473571
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