Receiver operational yield in optoelectronic-VLSI applications

Michael B. Venditti; David V. Plant

doi:10.1117/12.451606

15 November 2002 Receiver operational yield in optoelectronic-VLSI applications

Michael B. Venditti, David V. Plant

Proceedings Volume 4788, Photonic Devices and Algorithms for Computing IV; (2002) https://doi.org/10.1117/12.451606
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

It is well understood to be more difficult to operate an array of receivers simultaneously than individually, as sensitivity is degraded in the presence of simultaneous switching noise.^1,2In optoelectronic-VLSI applications, additional operability concerns exist due to the need to implement receiver circuits of reduced complexity due to physical space constraints and to bias and control receivers in groups. Operational yield refers to the percentage of receivers in a group that can simultaneously be operated successfully. Receivers in a group may be functional individually, but some may exhibit operational problems such as duty cycle distortion or stuck-at 1/0 behavior when operated as a group. The transfer characteristics of optically single-ended receivers can be sensitive to changes in biasing and control parameters. If a sensitive parameter is common to a group of receivers, operational yield can be compromised by problems caused by process variations in optoelectronic devices and in transmitter and receiver circuits, and non-uniformity in optical system power throughput. We present experimental and simulation-based analyses of operational yield for optically single-ended receivers in common bias and control groups. Architectures employing optically differential signaling are shown to facilitate approaches to alleviating operational yield problems.

Citation Download Citation

Michael B. Venditti and David V. Plant "Receiver operational yield in optoelectronic-VLSI applications", Proc. SPIE 4788, Photonic Devices and Algorithms for Computing IV, (15 November 2002); https://doi.org/10.1117/12.451606

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