Paper
19 November 2003 Analytical investigation of focused and diffracted laser beam
Rossella Zoli, Guido M. Oliva, Rinaldo Zocca, Giovanni Tartarini, Paolo Bassi
Author Affiliations +
Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524567
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy
Abstract
This paper presents an analytical model to evaluate both the longitudinal and the transversal intensity distributions of beams emitted by laser diodes, focused by a thin lens and diffracted by a circular aperture of arbitrary radius. The model evaluates the diffraction field in systems with any Fresnel number and has been validated successfully comparing theoretical results with experimental ones.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rossella Zoli, Guido M. Oliva, Rinaldo Zocca, Giovanni Tartarini, and Paolo Bassi "Analytical investigation of focused and diffracted laser beam", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.524567
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KEYWORDS
Semiconductor lasers

Diffraction

Systems modeling

Gaussian beams

Lithium

Beam shaping

Data modeling

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