Raman studies as a tool for characterization of the strained hexagonal GaN/AlxGa1-xN superlattices

V. Yu. Davydov; A. N. Smirnov; I. N. Goncharuk; R. N. Kyutt; M. P. Scheglov; M. V. Baidakova; W. V. Lundin; E. E. Zavarin; M. B. Smirnov; S. V. Karpov; H. Harima

doi:10.1117/12.511838

11 June 2003 Raman studies as a tool for characterization of the strained hexagonal GaN/Al_xGa_1-xN superlattices

V. Yu. Davydov, A. N. Smirnov, I. N. Goncharuk, R. N. Kyutt, M. P. Scheglov, M. V. Baidakova, W. V. Lundin, E. E. Zavarin, M. B. Smirnov, S. V. Karpov, H. Harima

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Proceedings Volume 5023, 10th International Symposium on Nanostructures: Physics and Technology; (2003) https://doi.org/10.1117/12.511838
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

It is shown that such parameters of GaN/Al_xGa_1-xN superlattice as the period, build-in strain, composition of the alloy, and individual layer thicknesses can be extracted from the energy positions, intensities, and line shapes of various optical and acoustical modes detected in Raman scattering.

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V. Yu. Davydov, A. N. Smirnov, I. N. Goncharuk, R. N. Kyutt, M. P. Scheglov, M. V. Baidakova, W. V. Lundin, E. E. Zavarin, M. B. Smirnov, S. V. Karpov, and H. Harima "Raman studies as a tool for characterization of the strained hexagonal GaN/Al_xGa_1-xN superlattices", Proc. SPIE 5023, 10th International Symposium on Nanostructures: Physics and Technology, (11 June 2003); https://doi.org/10.1117/12.511838

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