Low-frequency noise spectra of high-quality MCT photoconductors

Mikhail S. Nikitine; Galina V. Chekanova

doi:10.1117/12.517401

30 September 2003 Low-frequency noise spectra of high-quality MCT photoconductors

Mikhail S. Nikitine, Galina V. Chekanova

Proceedings Volume 5126, 17th International Conference on Photoelectronics and Night Vision Devices; (2003) https://doi.org/10.1117/12.517401
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

Low-frequency flicker-noise “1/f” spectra were examined on Photoconductive Mercury-Cadmium Telluride / Hg_1-xCd_xTe (PC MCT) infrared radiation detectors. Noise measurements were performed on PC MCT detectors with responsivity peak wavelength λ_p from 3,0 to 5,5 μm and from 10,5 to 12,0 μm at operating temperature T_op ≈ 205 - 210 K and ≈ 78 K respectively. Tested high quality PC MCT infrared radiation detectors show extremely low spectral density of excess “1/f” noise and low values of noise-knee frequency from 10 to 150 Hz and demonstrate high-level performance.

Citation Download Citation

Mikhail S. Nikitine and Galina V. Chekanova "Low-frequency noise spectra of high-quality MCT photoconductors", Proc. SPIE 5126, 17th International Conference on Photoelectronics and Night Vision Devices, (30 September 2003); https://doi.org/10.1117/12.517401

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