Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

Emilia Mitkova Mihaylova; Vincent Toal; Sridhar Reddy Guntaka; Suzanne Martin

doi:10.1117/12.519489

4 November 2003 Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element

Emilia Mitkova Mihaylova, Vincent Toal, Sridhar Reddy Guntaka, Suzanne Martin

Author Affiliations +

Proceedings Volume 5226, 12th International School on Quantum Electronics: Laser Physics and Applications; (2003) https://doi.org/10.1117/12.519489
Event: 12th International School on Quantum Electronics Laser Physics and Applications, 2002, Varna, Bulgaria

Abstract

An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerization process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.

Citation Download Citation

Emilia Mitkova Mihaylova, Vincent Toal, Sridhar Reddy Guntaka, and Suzanne Martin "Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element", Proc. SPIE 5226, 12th International School on Quantum Electronics: Laser Physics and Applications, (4 November 2003); https://doi.org/10.1117/12.519489

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