Paper
16 June 2004 1.3-μm VCSEL production issues
David W. Kisker, Leo M. F. Chirovsky, Ryan L. Naone, James M. Van Hove, Jennifer Marie Rossler, Martin Adamcyk, N. Wasinger, James G. Beltran, David Galt
Author Affiliations +
Abstract
1.3 μm VCSELs have been under development for several years. In this work, we discuss several requirements and characteristics that allow a device to be manufacturable in high volume with excellent yield.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David W. Kisker, Leo M. F. Chirovsky, Ryan L. Naone, James M. Van Hove, Jennifer Marie Rossler, Martin Adamcyk, N. Wasinger, James G. Beltran, and David Galt "1.3-μm VCSEL production issues", Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); https://doi.org/10.1117/12.539285
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CITATIONS
Cited by 10 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Semiconducting wafers

Process control

Temperature metrology

Reliability

Eye

Statistical analysis

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